1. Rapid reliability assessment of VLSICs
المؤلف: / A.P. Dorey ... (et al.)
المکتبة: مكتبات الكلية التقنية بجامعة طهران (طهران)
موضوع: Integrated circuits - Very large scale integration - Testing,Integrated circuits - Very large scale integration - Reliability
رده :
TK
7874
.
R37
1990
2. Testing and reliable design of CMOS circuits
المؤلف: Jha, Niraj K.
المکتبة: كتابخانه پژوهشگاه نیرو (طهران)
موضوع: ، Metal oxide semiconductors, Complimentary- Testing,، Metal oxide semiconductors, Complimentary- Reliability,، Integrated circuits- Very large scale integration- Design and construction
